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dorsaVi Advances RRAM Testing for Next-Gen AI Memory at 22-nm Node

8:56am on Friday 13th of March, 2026 AEDT Technology
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dorsaVi Advances RRAM Testing for Next-Gen AI Memory at 22-nm Node

8:56am on Friday 13th of March, 2026 AEDT
Key Points
  • Initial 180-nm RRAM test silicon received for device characterisation
  • Development targets advanced 22-nm node for higher density and efficiency
  • Focus on overcoming AI memory bottlenecks in robotics, drones, and autonomous systems
  • Neuromorphic computing capabilities integrated for ultra-low-power edge AI
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